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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl
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SYSNO ASEP 0481772 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve SCOPUS Title Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl Author(s) Kopeček, Jaromír (FZU-D) RID, ORCID
Jurek, Karel (FZU-D) RID
Kopecký, Vít (FZU-D)
Klimša, Ladislav (FZU-D)
Seiner, Hanuš (UT-L) RID
Sedlák, Petr (UT-L) RID
Landa, Michal (UT-L) RID
Dluhoš, J. (CZ)
Petrenec, M. (CZ)
Hladík, L. (CZ)
Doupal, A. (CZ)
Heczko, Oleg (FZU-D) RIDNumber of authors 12 Source Title Microscopy and Microanalysis - ISSN 1431-9276
Roč. 20, Aug (2014), s. 335-336Number of pages 2 s. Publication form Print - P Language eng - English Country US - United States Keywords scanning electron microscope ; SEM ; focused ion beam ; FIB ; xenon plasma focused ion beam ; dual beam ; shape memory alloy ; SMA Subject RIV BM - Solid Matter Physics ; Magnetism OBOR OECD Condensed matter physics (including formerly solid state physics, supercond.) Subject RIV - cooperation Institute of Thermomechanics R&D Projects GA14-03044S GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 ; UT-L - RVO:61388998 EID SCOPUS 84927913816 DOI 10.1017/S1431927614003390 Annotation The presented article reviews the first experiences with the xenon plasma focused ion beam (FIB) in the scanning electron microscope (SEM) applied on the investigations of shape memory alloys (SMAs). The SMA are the focus of investigation in our department for many years and these investigated alloys are examples of material prepared by novel spark plasma sintering method (NiTi) and traditional metallurgical method (CoNiAl). Thus apart of basic characterization it also facilitates the comparison between two different methods of preparation. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz ; Eva Popovová, popovova@fzu.cz Tel.: 220 318 579 Year of Publishing 2018
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