Number of the records: 1  

Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

  1. 1.
    SYSNO ASEP0481772
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve SCOPUS
    TitleXenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl
    Author(s) Kopeček, Jaromír (FZU-D) RID, ORCID
    Jurek, Karel (FZU-D) RID, ORCID, SAI
    Kopecký, Vít (FZU-D) ORCID
    Klimša, Ladislav (FZU-D) ORCID
    Seiner, Hanuš (UT-L) RID, ORCID
    Sedlák, Petr (UT-L) RID, ORCID
    Landa, Michal (UT-L) RID
    Dluhoš, J. (CZ)
    Petrenec, M. (CZ)
    Hladík, L. (CZ)
    Doupal, A. (CZ)
    Heczko, Oleg (FZU-D) RID, ORCID
    Number of authors12
    Source TitleMicroscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
    Roč. 20, Aug (2014), s. 335-336
    Number of pages2 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    Keywordsscanning electron microscope ; SEM ; focused ion beam ; FIB ; xenon plasma focused ion beam ; dual beam ; shape memory alloy ; SMA
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    Subject RIV - cooperationInstitute of Thermomechanics
    R&D ProjectsGA14-03044S GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271 ; UT-L - RVO:61388998
    EID SCOPUS84927913816
    DOI10.1017/S1431927614003390
    AnnotationThe presented article reviews the first experiences with the xenon plasma focused ion beam (FIB) in the scanning electron microscope (SEM) applied on the investigations of shape memory alloys (SMAs). The SMA are the focus of investigation in our department for many years and these investigated alloys are examples of material prepared by novel spark plasma sintering method (NiTi) and traditional metallurgical method (CoNiAl). Thus apart of basic characterization it also facilitates the comparison between two different methods of preparation.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2018
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.