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The Effect of Type and Concentration of Modifier in Supercritical Carbon Dioxide on Crystallization of Nanocrystalline Titania Thin Films.

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    SYSNO ASEP0481564
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleThe Effect of Type and Concentration of Modifier in Supercritical Carbon Dioxide on Crystallization of Nanocrystalline Titania Thin Films.
    Author(s) Sajfrtová, Marie (UCHP-M) RID, ORCID, SAI
    Cerhová, Marie (UCHP-M) SAI
    Jandová, Věra (UCHP-M) RID, ORCID, SAI
    Dřínek, Vladislav (UCHP-M) RID, ORCID, SAI
    Daniš, E. (CZ)
    Matějová, L. (CZ)
    Source TitleJournal of Supercritical Fluids. - : Elsevier - ISSN 0896-8446
    Roč. 133, MAR 2018 (2018), s. 211-217
    Number of pages7 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordstitania thin film ; supercritical carbon dioxide ; crystallization
    Subject RIVCF - Physical ; Theoretical Chemistry
    OECD categoryPhysical chemistry
    R&D ProjectsGA14-23274S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUCHP-M - RVO:67985858
    UT WOS000426234000026
    EID SCOPUS85032872745
    DOI10.1016/j.supflu.2017.10.012
    AnnotationNanostructured TiO2 anatase thin films were directly prepared using supercritical carbon dioxide (scCO2)modified by organic solvent and water in two step processing. Organic solvent used as(scCO2) modifier at 30 MPa and 40 °C in the first step of processing was in the second step changed to water with simultaneous temperature increase to 150 °C which caused anatase thin films crystallization. The effect of the type of modifier (water, methanol, ethanol and acetone), concentration of modifier (5–40 wt.%) in scCO2 and the amount of scCO2(50–200 g) passed through the high pressure column as well as the type of substrate (soda-lime glass and monocrystalline Si) on microstructure and purity of TiO2 thin films were examined in both steps of processing. The prepared thin films were characterized with respect to their (micro)structural properties by Raman spec-troscopy as well as X-ray diffraction, to their wettability by contact angle measurements and to their morphology by high resolution transmission electron microscopy.
    WorkplaceInstitute of Chemical Process Fundamentals
    ContactEva Jirsová, jirsova@icpf.cas.cz, Tel.: 220 390 227
    Year of Publishing2019
Number of the records: 1  

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