Comparison of LVEM5, LVEM25 and standard TEM

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SYSNO ASEP	0477368
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Comparison of LVEM5, LVEM25 and standard TEM
Author(s)	Coufalová, E. (CZ) Pavlova, Ewa (UMCH-V)_RID Šlouf, Miroslav (UMCH-V)_{RID, ORCID} Štěpán, P. (CZ) Drštička, M. (CZ) Kolařík, V. (CZ) Hozák, Pavel (UMG-J)_{RID, ORCID}
Source Title	Proceedings. - Lausanne : Swiss Society for Optics and Microscopy, 2017 S. 507-508
Number of pages	2 s.
Action	Microscopy Conference
Event date	21.08.2017 - 25.08.2017
VEvent location	Lausanne
Country	CH - Switzerland
Event type	WRD
Language	eng - English
Country	CH - Switzerland
Keywords	electron microscopy ; nanostructure of materials
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
Institutional support	UMCH-V - RVO:61389013 ; UMG-J - RVO:68378050
Workplace	Institute of Macromolecular Chemistry
Contact	Eva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358
Year of Publishing	2018

Number of the records: 1