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Graphene oxide layers modified by light energetic ions

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    SYSNO ASEP0475667
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleGraphene oxide layers modified by light energetic ions
    Author(s) Malinský, Petr (UJF-V) RID
    Macková, Anna (UJF-V) RID
    Mikšová, Romana (UJF-V) RID
    Kováčiková, Helena (UJF-V)
    Cutroneo, Mariapompea (UJF-V)
    Luxa, J. (CZ)
    Bouša, D. (CZ)
    Štrochová, B. (CZ)
    Sofer, Z. (CZ)
    Number of authors9
    Source TitlePhysical Chemistry Chemical Physics. - : ROYAL SOC CHEMISTRY - ISSN 1463-9076
    Roč. 19, č. 16 (2017), s. 10282-10291
    Number of pages10 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    Keywordsgraphene oxide ; reduction ; irradiation
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OBOR OECDNuclear physics
    R&D ProjectsGA16-05167S GA ČR - Czech Science Foundation (CSF)
    LM2015056 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUJF-V - RVO:61389005
    UT WOS000400117700009
    EID SCOPUS85019983447
    AnnotationIn this paper, the effect of light ion irradiation on graphene oxide foil structure and composition was studied. Due to the excellent properties of graphene based materials suitable for application in electronics, optoelectronics, micro-mechanics and space technologies, the interaction of energetic ions with graphene based structures is worth studying. From the fundamental point of view, it is also interesting to get information about graphene oxide structure modification and the possible functional properties after irradiation by energetic ions. The light ion irradiation of graphene oxide ( GO) foil was performed using 2.5 MeV H+ and 5.1 MeV He2+ ions. The change in the elemental composition of the GO foils after ion irradiation was investigated using Rutherford Backscattering Spectrometry and Elastic Recoil Detection Analysis. The influence of ion irradiation was further studied by microscopy methods. The chemical composition and structural changes of the GO foil surface were characterized by spectroscopy techniques including XPS, FTIR and Raman spectroscopy. Although the results of ion beam analysis indicated no significant compositional changes in the bulk of GO foils connected to ion irradiation, XPS, ATR-FTIR and Raman spectroscopy revealed reduction and removal of oxygen functionalities on the surface of graphene oxide. This reduction leads to a surface resistivity decrease after ion irradiation dependent on the ion species, fluence and energy.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová,, Tel.: 266 173 228 ; Renata Glasová,, Tel.: 266 177 223
    Year of Publishing2018
Number of the records: 1