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First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system
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SYSNO ASEP 0471582 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system Author(s) Krůs, Miroslav (FZU-D) RID
Levato, Tadzio (FZU-D)
Kim, H. T. (KR)
Grittani, Gabriele Maria (FZU-D) ORCID
Margarone, Daniele (FZU-D) RID, ORCID
Jeong, Tae Moon (FZU-D) ORCID
Mocek, Tomáš (FZU-D) RID, ORCID, SAI
Korn, Georg (FZU-D) RID, ORCIDArticle number 95151K Source Title Research Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II. - Bellingham : SPIE, 2015 / Korn G. ; Silva L.O. - ISSN 0277-786X - ISBN 978-1-62841-636-7 Pages s. 1-9 Number of pages 9 s. Publication form Print - P Action Research Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II Event date 13.04.2015-15.04.2015 VEvent location Praha Country CZ - Czech Republic Event type WRD Language eng - English Country US - United States Keywords laser wakefield acceleration ; transverse emittance measurement Subject RIV BL - Plasma and Gas Discharge Physics R&D Projects EE2.3.20.0279 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ED1.1.00/02.0061 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 UT WOS 000356920800025 EID SCOPUS 84946025984 DOI 10.1117/12.2179483 Annotation The quadrupole lens free multiple profile emittance measurement method is an adaptation of the standard multiple profile monitor method for electron beam emittance measurement which was tested at PW laser system. This single shot technique allows to obtain the emittance from beam profile radii fit by means of Twiss (Courant-Snyder) parameters.
Lanex scintillating screens were used as profile monitors due to their high yield of visible photons. However, on the other hand, the screen is a source of multiple Coulomb scattering which can influence the beam profile on the followingscreens at relatively low electron energies.Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2017
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