Number of the records: 1  

First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system

  1. 1.
    SYSNO ASEP0471582
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleFirst experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system
    Author(s) Krůs, Miroslav (FZU-D) RID
    Levato, Tadzio (FZU-D)
    Kim, H. T. (KR)
    Grittani, Gabriele Maria (FZU-D) ORCID
    Margarone, Daniele (FZU-D) RID, ORCID
    Jeong, Tae Moon (FZU-D) ORCID
    Mocek, Tomáš (FZU-D) RID, ORCID, SAI
    Korn, Georg (FZU-D) RID, ORCID
    Article number95151K
    Source TitleResearch Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II. - Bellingham : SPIE, 2015 / Korn G. ; Silva L.O. - ISSN 0277-786X - ISBN 978-1-62841-636-7
    Pagess. 1-9
    Number of pages9 s.
    Publication formPrint - P
    ActionResearch Using Extreme Light - Entering New Frontiers with Petawatt-Class Lasers II
    Event date13.04.2015-15.04.2015
    VEvent locationPraha
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordslaser wakefield acceleration ; transverse emittance measurement
    Subject RIVBL - Plasma and Gas Discharge Physics
    R&D ProjectsEE2.3.20.0279 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    ED1.1.00/02.0061 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000356920800025
    EID SCOPUS84946025984
    DOI10.1117/12.2179483
    AnnotationThe quadrupole lens free multiple profile emittance measurement method is an adaptation of the standard multiple profile monitor method for electron beam emittance measurement which was tested at PW laser system. This single shot technique allows to obtain the emittance from beam profile radii fit by means of Twiss (Courant-Snyder) parameters.
    Lanex scintillating screens were used as profile monitors due to their high yield of visible photons. However, on the other hand, the screen is a source of multiple Coulomb scattering which can influence the beam profile on the followingscreens at relatively low electron energies.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2017
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.