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Influence of non-adherent yeast cells on electrical characteristics of diamond-based field-effect transistors
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SYSNO ASEP 0470423 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Influence of non-adherent yeast cells on electrical characteristics of diamond-based field-effect transistors Author(s) Procházka, Václav (FZU-D) ORCID
Cifra, Michal (URE-Y) RID, ORCID, SAI
Kulha, Pavel (FZU-D)
Ižák, Tibor (FZU-D) RID
Rezek, Bohuslav (FZU-D) RID, ORCID
Kromka, Alexander (FZU-D) RID, ORCID, SAISource Title Applied Surface Science. - : Elsevier - ISSN 0169-4332
Roč. 395, Feb (2017), s. 214-219Number of pages 6 s. Language eng - English Country NL - Netherlands Keywords nanocrystalline diamond ; yeast cells ; field-effect transistor ; transfer characteristics pH sensitivity Subject RIV BO - Biophysics OECD category Biophysics R&D Projects GBP108/12/G108 GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 ; URE-Y - RVO:67985882 UT WOS 000390428300036 EID SCOPUS 84967155237 DOI 10.1016/j.apsusc.2016.05.003 Annotation Diamond thin films provide unique features as substrates for cell cultures and as bio-electronic sensors. Here we employ solution-gated field effect transistors (SGFET) based on nanocrystalline diamond thin films with H-terminated surface which exhibits the sub-surface p-type conductive channel. We study an influence of yeast cells (Saccharomyces cerevisiae) on electrical characteristics of the diamond SGFETs. Two different cell culture solutions (sucrose and yeast peptone dextrose–YPD) are used, with and without the cells. We have found that transfer characteristics of the SGFETs exhibit a negative shift of the gate voltage by −26 mV and −42 mV for sucrose and YPD with cells in comparison to blank solutions without the cells. This effect is attributed to a local pH change in close vicinity of the H-terminated diamond surface due to metabolic processes of the yeast cells.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2017
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