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Reflected and transmitted mode in the scanning low energy electron microscope
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SYSNO ASEP 0467260 Document Type C - Proceedings Paper (int. conf.) R&D Document Type The record was not marked in the RIV Title Reflected and transmitted mode in the scanning low energy electron microscope Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Mikmeková, Eliška (UPT-D) RID
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 5 Source Title 2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). - Toyama : University of Toyama, 2016 Pages s. 29-30 Number of pages 2 s. Publication form Print - P Action Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2) Event date 13.10.2016 - 14.10.2016 VEvent location Toyama Country JP - Japan Event type WRD Language eng - English Country JP - Japan Keywords SLEEM Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 Annotation Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen for observation through the specimen for observation throughout the full energy scale down to units of electronvolts. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2017
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