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Quadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams

  1. 1.
    SYSNO ASEP0466848
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleQuadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams
    Author(s) Krůs, Miroslav (FZU-D) RID
    Laštovička, Tomáš (FZU-D) RID, ORCID
    Levato, Tadzio (FZU-D)
    Number of authors3
    Source TitleNuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
    Roč. 810, Feb (2016), s. 32-36
    Number of pages5 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordsscattering ; plasma
    Subject RIVBL - Plasma and Gas Discharge Physics
    R&D ProjectsED1.1.00/02.0061 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    EE2.3.20.0279 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000368632900006
    EID SCOPUS84960927242
    DOI10.1016/j.nima.2015.11.116
    AnnotationA quadrupole lens-free diagnostic is a simple single shot method which can be used to measure the electron beam transverse emittance. LANEX screens are used as profile monitors due to the high yield of visible photons which can be easily detected by standard camera sensors. This type of minimally destructive diagnostics is particularly suitable for electron beams accelerated by the laser wakefield mechanism where the basic parameters of such beams fluctuate shot-to-shot mainly during the beam optimizing process.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2017
Number of the records: 1  

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