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Time-resolved measurement of thermally induced aberrations in a cryogenically cooled Yb:YAG slab with a wavefront sensor
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SYSNO ASEP 0466507 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Time-resolved measurement of thermally induced aberrations in a cryogenically cooled Yb:YAG slab with a wavefront sensor Author(s) Sikocinski, Pawel (FZU-D) RID
Novák, Ondřej (FZU-D) RID, ORCID
Smrž, Martin (FZU-D) RID, ORCID
Pilař, Jan (FZU-D) RID, ORCID
Jambunathan, Venkatesan (FZU-D)
Jelínková, H. (CZ)
Endo, Akira (FZU-D) RID
Lucianetti, Antonio (FZU-D) RID, ORCID
Mocek, Tomáš (FZU-D) RID, ORCID, SAINumber of authors 9 Article number 73 Source Title Applied Physics B-Lasers and Optics. - : Springer - ISSN 0946-2171
Roč. 122, č. 4 (2016), 1-10Number of pages 10 s. Language eng - English Country DE - Germany Keywords solid-state laser ; Yb-Yag Subject RIV BH - Optics, Masers, Lasers R&D Projects ED2.1.00/01.0027 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EE2.3.20.0143 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LO1602 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA14-01660S GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 UT WOS 000372894600006 EID SCOPUS 84961595330 DOI 10.1007/s00340-016-6342-y Annotation The time-resolved measurements of thermally induced wavefront aberrations in a cryogenically cooled Yb:YAG crystal are presented in dependence on temperature in the range between 250 and 130 K under non-lasing condition. A wavefront sensor was utilized to determine the wavefront aberrations. The wavefront distortions were experimentally studied for a cryogenically cooled Yb: YAG crystal in detail for the first time. The wavefront aberrations were significantly reduced at cryogenic temperatures including defocus which was the dominant aberration and which was responsible for the so-called thermal lensing effect. We found that defocus aberration is caused not only by thermally induced effects (responsible for thermal lens), but also by electronically induced change in the refractive index due to excitation of ion activators which is responsible for the electronic lensing. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2017
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