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Study of Plant Waxes Using Low Temperature Method for ESEM

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    SYSNO ASEP0465203
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleStudy of Plant Waxes Using Low Temperature Method for ESEM
    Author(s) Neděla, Vilém (UPT-D) RID, ORCID, SAI
    Tihlaříková, Eva (UPT-D) RID, ORCID, SAI
    Schiebertová, P. (CZ)
    Zajícová, I. (CZ)
    Schwarzerová, K. (CZ)
    Number of authors5
    Source TitleMicroscopy and Microanalysis - ISSN 1431-9276
    Roč. 22, S3 (2016), s. 1180-1181
    Number of pages2 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    KeywordsESEM ; plant waxes ; low temperature method
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGA14-22777S GA ČR - Czech Science Foundation (CSF)
    ED0017/01/01 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUPT-D - RVO:68081731
    DOI10.1017/S1431927616006747
    AnnotationA possibility to study biological samples in their native state, or even living organisms, using an environmental scanning electron microscope (ESEM) is of great importance for biologists. Sputter-free, electrically non-conductive and wet biological samples in their living and native state are observed using ESEM under conditions of high pressure water vapors that ranges from units to thousands of Pa in the ESEM specimen chamber. One of unwanted consequences of the electron beam-gas interaction is the electrons scattering that results in beam spot defocusing followed by the decrease of the detected signalto-noise ratio. This can be compensated by the reduction of beam electrons gas path length and scanning speed or by the increasing of the beam energy. The latter two parameters fundamentally enhance radiation damage of sensitive and soft native samples and represent a limiting factor for their observation using ESEM. This problem can be overcome by the use of special methods like Low Temperature Method for the ESEM (LTM), ideally in a combination with advanced low noise detectors with very high detection efficiencies.
    WorkplaceInstitute of Scientific Instruments
    ContactJan Slaměník, jan@isibrno.cz, Tel.: 541 514 205 ; Miluše Langová, langova@isibrno.cz
    Year of Publishing2017
Number of the records: 1