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FeS.sub.2./sub. thin films deposition by reactive high power magnetron sputtering in Ar+H.sub.2./sub.S gas mixture
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SYSNO ASEP 0464298 Document Type A - Abstract R&D Document Type O - Ostatní Title FeS2 thin films deposition by reactive high power magnetron sputtering in Ar+H2S gas mixture Author(s) Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
Čada, Martin (FZU-D) RID, ORCID, SAI
Kment, Štěpán (FZU-D) RID, ORCID
Olejníček, Jiří (FZU-D) RID, ORCIDSource Title International Conference on Plasma Surface Engineering. Abstracts. ( PSE 2016 ) /15./. - Braunschweig : European Joint Committee on Plasma and Ion Surface Engineering (EJC / PISE), 2016
S. 137-137Number of pages 1 s. Publication form Online - E Action International Conference on Plasma Surface Engineering ( PSE 2016 ) Event date 12.09.2016 - 16.09.2016 VEvent location Garmisch-Partenkirchen Country DE - Germany Event type WRD Language eng - English Country DE - Germany Keywords sputtering ; HIPIMS ; films ; semiconductor ; deposition Subject RIV BL - Plasma and Gas Discharge Physics R&D Projects TA03010743 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support FZU-D - RVO:68378271 Annotation Polycrystalline and nanocrystalline semiconducting iron pyrite FeS2 is recently an attractive material for optoelectronic and photonic applications. Due to its relatively large optical absorption coefficient in the visible region and narrow band gap of 0.95 ev this material can be suitable for applications in photovoltaics, photodetectors and photoelectrochemistry. Semiconducting polycrystalline and nanocrystalline FeS2 thin films were deposited by high power impulse magnetron reactive sputtering system (R-HIPIMS). The magnetron system with SmCo magnets and a pure circular iron target (diameter 50 mm) was used for the impulse reactive sputtering. The gas mixture of Ar and H2S was used for the reactive sputtering process. The partial pressure of H2S in the deposition plasma reactor was changed in a wide range. The substrate was heated during the deposition by an external furnace and the deposition temperature was controlled in the range 300-600 K. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2017
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