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Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass
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SYSNO ASEP 0458106 Document Type V - Research Report R&D Document Type V - Research Report Title Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass Author(s) Vaněček, Milan (FZU-D) RID
Holovský, Jakub (FZU-D) RID, ORCID
Poruba, Aleš (FZU-D) RID
Remeš, Zdeněk (FZU-D) RID, ORCID
Purkrt, Adam (FZU-D) RIDIssue data Praha: Tel Solar AG, Trübbach, Switzerland, 2015 Number of pages 22 s. Publication form Online - E Language eng - English Country CZ - Czech Republic Keywords optical properties ; amorphous silicon ; microcrystalline silicon ; ZnO Subject RIV BM - Solid Matter Physics ; Magnetism Next source Non-public resources Annotation Optical and photoelectrical properties of materials from TEL Solar were characterized in the Institute of Physics, AS CR in a broad spectral region and a high dynamic range. Conclusions on material properties with respect to thin film silicon solar cells were drawn. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
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