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Optical Properties of Titania Coatings Prepared by Inkjet Direct Patterning of a Reverse Micelles Sol-Gel Composition.

SYSNO ASEP	0457723
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Optical Properties of Titania Coatings Prepared by Inkjet Direct Patterning of a Reverse Micelles Sol-Gel Composition.
Author(s)	Schmiedová, V. (CZ) Dzik, P. (CZ) Veselý, M. (CZ) Zmeškal, O. (CZ) Morozová, Magdalena (UCHP-M)_{RID, SAI} Klusoň, Petr (UCHP-M)_{RID, ORCID, SAI}
Source Title	Molecules. - : MDPI Roč. 20, č. 8 (2015), s. 14552-14564
Number of pages	13 s.
Language	eng - English
Country	CH - Switzerland
Keywords	material printing ; inkjet ; ellipsometry
Subject RIV	CI - Industrial Chemistry, Chemical Engineering
R&D Projects	TA03010548 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
	FR-TI1/144 GA MPO - Ministry of Industry and Trade (MPO)
Institutional support	UCHP-M - RVO:67985858
UT WOS	000361375400063
EID SCOPUS	84941243749
DOI	10.3390/molecules200814552
Annotation	Thin layers of titanium dioxide were fabricated by direct inkjet patterning of a reverse micelles sol-gel composition onto soda-lime glass plates. Several series of variable thickness samples were produced by repeated overprinting and these were further calcined at different temperatures. The resulting layers were inspected by optical and scanning electronic microscopy and their optical properties were investigated by spectroscopic ellipsometry in the range of 200-1000 nm. Thus the influence of the calcination temperature on material as well as optical properties of the patterned micellar titania was studied. The additive nature of the deposition process was demonstrated by a linear dependence of total thickness on the number of printed layers without being significantly affected by the calcination temperature. The micellar imprints structure of the titania layer resulted into significant deviation of measured optical constants from the values reported for bulk titania. The introduction of a void layer into the ellipsometric model was found necessary for this particular type of titania and enabled correct ellipsometric determination of layer thickness, well matching the thickness values from mechanical profilometry.
Workplace	Institute of Chemical Process Fundamentals
Contact	Eva Jirsová, jirsova@icpf.cas.cz, Tel.: 220 390 227
Year of Publishing	2016

Number of the records: 1