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Characterisation of silicon carbide layers formed during BNCD deposition
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SYSNO ASEP 0456477 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Characterisation of silicon carbide layers formed during BNCD deposition Author(s) Taylor, Andrew (FZU-D) RID, ORCID
Ashcheulov, Petr (FZU-D) ORCID, RID
Čada, Martin (FZU-D) RID, ORCID, SAI
Drahokoupil, Jan (FZU-D) RID, ORCID
Fekete, Ladislav (FZU-D) RID, ORCID
Klimša, Ladislav (FZU-D) ORCID
Olejníček, Jiří (FZU-D) RID, ORCID
Remeš, Zdeněk (FZU-D) RID, ORCID
Čtvrtlík, R. (CZ)
Tomáštík, J. (CZ)
Janíček, P. (CZ)
Mistrík, J. (CZ)
Kopeček, Jaromír (FZU-D) RID, ORCID
Mortet, Vincent (FZU-D) RID, ORCIDSource Title Diamond Conference. - Coventry : University of Warwick, 2015 / Newton M.
P6.1-P6.3Number of pages 3 s. Publication form Print - P Action De Beers Diamond Conference 2015 Event date 06.07.2015 - 09.07.2015 VEvent location Warwick Country GB - United Kingdom Event type WRD Language eng - English Country GB - United Kingdom Keywords silicon carbide ; nano-crystalline diamond Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA13-31783S GA ČR - Czech Science Foundation (CSF) LO1409 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2011029 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 Annotation In this work, we further detail properties of silicon carbide (SiC) layers [1] grown by microwave plasma enhanced chemical vapour deposition with linear antenna delivery (MW-LA-PECVD) on silicon substrates using low CO2 concentrations and compare them with nano-crystalline diamond (NCD) layers grown using similar conditions. Structural, mechanical and optical properties of these layers are compared for their potential use as transparent hard coatings for optical IR windows.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
Number of the records: 1