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Thin film polycrystalline Si solar cells studied in transient regime by optical pump-terahertz probe spectroscopy

SYSNO ASEP	0455242
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Thin film polycrystalline Si solar cells studied in transient regime by optical pump-terahertz probe spectroscopy
Author(s)	Pikna, Peter (FZU-D)_RID Skoromets, Volodymyr (FZU-D)_RID Becker, C. (DE) Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kužel, Petr (FZU-D)_{RID, ORCID, SAI}
Source Title	Applied Physics Letters. - : AIP Publishing - ISSN 0003-6951 Roč. 107, č. 23 (2015), "233901-1"-"233901-5"
Number of pages	5 s.
Language	eng - English
Country	US - United States
Keywords	thin film polycrystalline silicon ; terahertz spectroscopy ; passivation ; Suns-Voc method ; defects
Subject RIV	BM - Solid Matter Physics ; Magnetism
R&D Projects	GA13-12386S GA ČR - Czech Science Foundation (CSF)
Institutional support	FZU-D - RVO:68378271
UT WOS	000367010800068
EID SCOPUS	84949199135
DOI	10.1063/1.4937388
Annotation	We used time-resolved terahertz spectroscopy to study ultrafast photoconductivity of polycrystalline thin-film silicon solar cells. We selected a series of samples, which exhibited variable conversion efficiencies due to hydrogen plasma passivation under various technological conditions. The decay of the transient terahertz conductivity shows two components: the fast one is related to the charge recombination at interfaces, while the slow nanosecond one is attributed to the trapping of photocarriers by defects localized at grain boundaries or at dislocations in the polycrystalline p- layer of the structure. We observed a clear correlation between the open-circuit voltage and the nanosecond-scale decay time of the transient terahertz conductivity of the solar cells. Thus, the terahertz spectroscopy appears to be a useful contactless tool for inspecting the local photoconductivity of solar cells including, in particular, various nanostructured schemes.
Workplace	Institute of Physics
Contact	Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
Year of Publishing	2016

Number of the records: 1