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Crystal structure and magnetic properties of UO.sub.2./sub./permalloy thin films
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SYSNO ASEP 0455195 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Crystal structure and magnetic properties of UO2/permalloy thin films Author(s) Tereshina, Evgeniya (FZU-D) RID
Daniš, S. (CZ)
Springell, R. (GB)
Bao, Z. (NL)
Havela, L. (CZ)
Caciuffo, R. (DE)Source Title Thin Solid Films. - : Elsevier - ISSN 0040-6090
Roč. 591, Sep (2015), s. 271-275Number of pages 5 s. Language eng - English Country CH - Switzerland Keywords exchange bias ; permalloy ; uranium dioxide Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GP13-25866P GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 UT WOS 000362008000022 EID SCOPUS 84942828699 DOI 10.1016/j.tsf.2015.05.014 Annotation The exchange bias effect was studied on antiferromagnetic-ferromagnetic UO2/permalloy (Ni80Fe20) thin films. Films with a fixed thickness of UO2 layer and variable thickness of the covering Ni80Fe20 layer have been grown by reactive sputter deposition. The X-ray diffraction study showed epitaxial growth of the UO2 layer on (100) CaF2 substrates and a polycrystalline permalloy layer on top of it. The samples exhibited perpendicular exchange bias with the maximum magnitude of 22 mT found in UO2/Ni80Fe20 with the thinnest permalloy of 177 A. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
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