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Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy
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SYSNO ASEP 0451941 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy Author(s) Moreno, C. (JP)
Stetsovych, Oleksandr (FZU-D) ORCID
Shimizu, T.K. (JP)
Custance, O. (JP)Source Title Nano Letters. - : American Chemical Society - ISSN 1530-6984
Roč. 15, č. 4 (2015), s. 2257-2262Number of pages 6 s. Language eng - English Country US - United States Keywords noncontact atomic force microscopy (NC-AFM) ; submolecular resolution ; three-dimensional dynamic force spectroscopy ; high-resolution imaging Subject RIV BM - Solid Matter Physics ; Magnetism Institutional support FZU-D - RVO:68378271 UT WOS 000352750200007 EID SCOPUS 84926611569 DOI 10.1021/nl504182w Annotation Here we present a method for high-resolution imaging of nonplanar molecules and 3D surface systems using AFM with silicon cantilevers as force sensors. We demonstrate this method by resolving the step-edges of the (101) anatase surface at the atomic scale by simultaneously visualizing the structure of a pentacene molecule together with the atomic positions of the substrate and by resolving the contour and probe-surface force field on a C60 molecule with intramolecular resolution. The method reported here holds substantial promise for the study of 3D surface systems such as nanotubes, clusters, nanoparticles, polymers, and biomolecules using AFM with high resolution. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
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