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Ferromagnetic and paramagnetic magnetization of implanted GaN:Ho,Tb,Sm,Tm films
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SYSNO ASEP 0450317 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Ferromagnetic and paramagnetic magnetization of implanted GaN:Ho,Tb,Sm,Tm films Author(s) Maryško, Miroslav (FZU-D) RID
Hejtmánek, Jiří (FZU-D) RID, ORCID
Laguta, Valentyn (FZU-D) RID, ORCID
Sofer, Z. (CZ)
Sedmidubský, D. (CZ)
Šimek, P. (CZ)
Veselý, M. (CZ)
Mikulics, M. (DE)
Buchal, C. (DE)
Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Wilhelm, R. A. (DE)Source Title Journal of Applied Physics. - : AIP Publishing - ISSN 0021-8979
Roč. 117, č. 17 (2015), "17B907-1"-"17B907-4"Number of pages 4 s. Language eng - English Country US - United States Keywords magnetic field, ; ferromagnetic and paramagnetic magnetization Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GA13-20507S GA ČR - Czech Science Foundation (CSF) GBP108/12/G108 GA ČR - Czech Science Foundation (CSF) LM2011019 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 ; UJF-V - RVO:61389005 UT WOS 000354984100230 EID SCOPUS 84926467629 DOI https://doi.org/10.1063/1.4916761 Annotation The SQUID magnetic measurements were performed on the GaN films prepared by metal-organic vapour phase epitaxy and implanted by Tb3+, Tm3+, Sm3+, and Ho3+ ions. The sapphire substrate was checked by the electron paramagnetic resonance method which showed a content of Cr3+ and Fe3+ impurities. The samples 5x5mm2 were positioned in the classical straws and within an estimated accuracy of 10-6 emu, no ferromagnetic moment was detected in the temperature region of 2–300K. The paramagnetic magnetization was studied for parallel and perpendicular orientation. In the case of GaN:Tb sample, at T=2K, a pronounced anisotropy with the easy axis perpendicular to the film was observed which can be explained by the lowest quasi-doublet state of the non-Kramers Tb3+ ion. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
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