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On the improvement of PEC activity of hematite thin films deposited by high-power pulsed magnetron sputtering method
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SYSNO ASEP 0449337 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title On the improvement of PEC activity of hematite thin films deposited by high-power pulsed magnetron sputtering method Author(s) Kment, Š. (CZ)
Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
Krysa, C. (CZ)
Sekora, D. (US)
Zlámal, M. (CZ)
Olejníček, Jiří (FZU-D) RID, ORCID
Čada, Martin (FZU-D) RID, ORCID, SAI
Kšírová, Petra (FZU-D) RID, ORCID
Remeš, Zdeněk (FZU-D) RID, ORCID
Schmuki, P. (DE)
Schubert, E. (US)
Zbořil, R. (CZ)Source Title Applied Catalysis B - Environmental. - : Elsevier - ISSN 0926-3373
Roč. 165, Apr (2015), s. 344-350Number of pages 7 s. Language eng - English Country NL - Netherlands Keywords ALD ; HiPIMS ; passivation layer ; photoelectrochemical water splitting ; very thin films Subject RIV BL - Plasma and Gas Discharge Physics R&D Projects GAP108/12/2104 GA ČR - Czech Science Foundation (CSF) LH12043 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 UT WOS 000347584200038 EID SCOPUS 84908627727 DOI 10.1016/j.apcatb.2014.10.015 Annotation Iron oxide (α-Fe2O3) hematite films were prepared by a novel high-power impulse magnetron sputtering method (HiPIMS). Some of the crucial issues of hematite are a large overpotential needed to develop the water oxidation photocurrent onset, high extent of surface defects acting as traps, and a short diffusion length (2–4 nm) of photogenerated holes. We report on minimizing these limits by deposition of highly photoactive nanocrystalline very thin ( 30 nm) absorbing hematite films by HiPIMS and their passivation by ultra-thin ( 2 nm) atomic layer deposited (ALD) isocrystalline alumina oxide (α-Al2O3) films. A new approach of one-step annealing of this bilayer system is introduced. The films were judged on the basis of physical properties such as crystalline structure, optical absorption, surface topography, and electronic properties. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2016
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