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On the improvement of PEC activity of hematite thin films deposited by high-power pulsed magnetron sputtering method

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    SYSNO ASEP0449337
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleOn the improvement of PEC activity of hematite thin films deposited by high-power pulsed magnetron sputtering method
    Author(s) Kment, Š. (CZ)
    Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
    Krysa, C. (CZ)
    Sekora, D. (US)
    Zlámal, M. (CZ)
    Olejníček, Jiří (FZU-D) RID, ORCID
    Čada, Martin (FZU-D) RID, ORCID, SAI
    Kšírová, Petra (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Schmuki, P. (DE)
    Schubert, E. (US)
    Zbořil, R. (CZ)
    Source TitleApplied Catalysis B - Environmental. - : Elsevier - ISSN 0926-3373
    Roč. 165, Apr (2015), s. 344-350
    Number of pages7 s.
    Languageeng - English
    CountryNL - Netherlands
    KeywordsALD ; HiPIMS ; passivation layer ; photoelectrochemical water splitting ; very thin films
    Subject RIVBL - Plasma and Gas Discharge Physics
    R&D ProjectsGAP108/12/2104 GA ČR - Czech Science Foundation (CSF)
    LH12043 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000347584200038
    EID SCOPUS84908627727
    DOI10.1016/j.apcatb.2014.10.015
    AnnotationIron oxide (α-Fe2O3) hematite films were prepared by a novel high-power impulse magnetron sputtering method (HiPIMS). Some of the crucial issues of hematite are a large overpotential needed to develop the water oxidation photocurrent onset, high extent of surface defects acting as traps, and a short diffusion length (2–4 nm) of photogenerated holes. We report on minimizing these limits by deposition of highly photoactive nanocrystalline very thin ( 30 nm) absorbing hematite films by HiPIMS and their passivation by ultra-thin ( 2 nm) atomic layer deposited (ALD) isocrystalline alumina oxide (α-Al2O3) films. A new approach of one-step annealing of this bilayer system is introduced. The films were judged on the basis of physical properties such as crystalline structure, optical absorption, surface topography, and electronic properties.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2016
Number of the records: 1  

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