Number of the records: 1  

Examination of Graphene with Very Slow Electrons

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    SYSNO ASEP0437839
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleExamination of Graphene with Very Slow Electrons
    Author(s) Mikmeková, Eliška (UPT-D) RID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Number of authors2
    Source TitleNANOCON 2014. 6th International conference proceedings. - Ostrava : TANGER, 2014 - ISBN 978-80-87294-55-0
    Number of pages6 s.
    Publication formMedium - C
    ActionNANOCON 2014. International Conference /6./
    Event date05.11.2014-07.11.2014
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsgraphene ; slow electrons ; very low energy scanning electron microscopy ; ultralow energy STEM
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsTE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUPT-D - RVO:68081731
    UT WOS000350636300127
    AnnotationAlthough graphene has been available and intensively studied for nearly a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning electron microscopy with slow and very slow electrons offers an innovative tool enabling one to see graphene samples at nanometer or even sub-nanometer lateral resolution in both transmitted and reflected electrons and to count the number of layers reliably in both imaging modes. Diagnostics can be performed in this way on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. Moreover, bombardment with very slow electrons acts as an ultimate cleaning procedure removing adsorbed gases from crystal surfaces which can be monitored in scanned transmission electron images taken at below 50 eV.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2015
Number of the records: 1  

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