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Measurement of lattice parameters of single crystals and thin layers
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SYSNO ASEP 0432123 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Measurement of lattice parameters of single crystals and thin layers Author(s) Drahokoupil, Jan (FZU-D) RID, ORCID
Veřtát, P. (CZ)
Richterová, Kristina (FZU-D)
Laufek, František (FZU-D) RIDSource Title Materials Structure in Chemistry, Biology, Physics and Technology. - : Czech and Slovak Crystallographic Association - ISSN 1211-5894
Roč. 21, č. 2 (2014), s. 97-97Number of pages 1 s. Action Struktura 2014 : kolokvium Krystalografické společnosti Event date 09.06.2014-12.06.2014 VEvent location Kutná Hora Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords XRD ; lattice parameters Subject RIV BM - Solid Matter Physics ; Magnetism Institutional support FZU-D - RVO:68378271 Annotation The precise measurement o lattice parameters plays an important role in determination a temperature of phase transitions or coefficients of thermal expansions. Usually it is performed on a powder or a bulk sample. Although the measurement of single crystals shows some complications, it has also many advantages. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2015
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