Number of the records: 1  

Measurement of coherence properties of scanning electron microscope

  1. 1.
    SYSNO ASEP0431335
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleMeasurement of coherence properties of scanning electron microscope
    Author(s) Řiháček, Tomáš (UPT-D) RID, ORCID
    Lenc, M. (CZ)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors3
    Source Title9th International Conference on Charged Particle Optics. Book of Abstracts. - Brno : Institute of Scientific Instruments AS CR, v. v. i, 2014 - ISBN 978-80-87441-11-4
    S. 65
    Number of pages1 s.
    Publication formPrint - P
    ActionInternational Conference on Charged Parrticle Optics /9./
    Event date31.08.2014-05.09.2014
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordscoherence ; diffraction ; scanning electron microscope
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsTE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    AnnotationCoherence of an electron beam is an important characteristic in the transmission electron microscope. It can be determined through the visibility of interference fringes in a diffraction pattern. On the other hand, the coherence of the beam is not usually important for the standard applications of a scanning electron microscope (SEM). Nevertheless it can be of importance for some specific cases. We make use of the experimental setup similar to that used in [1]. The arrangement is shown in Fig. 1, where the diffraction grating is approximately translationally invariant with respect to the both transverse directions. In the interpretation of diffraction pattern we consider the effect of both non-vanishing source size and finite energy spread of the electron beam. The chromatic aberration of the objective lens is taken into account as well.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2015
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.