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Reflectivity of very low energy electrons from polycrystalline metal samples

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    SYSNO ASEP0422680
    Document TypeK - Proceedings Paper (Czech. conf.)
    R&D Document TypeThe record was not marked in the RIV
    TitleReflectivity of very low energy electrons from polycrystalline metal samples
    Author(s) Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
    Number of authors1
    Source TitleMikroskopie 2013. - Praha : Československá mikroskopická společnost, 2013
    S. 9
    Number of pages1 s.
    Publication formPrint - P
    ActionMikroskopie 2013
    Event date13.05.2013-14.05.2013
    VEvent locationLednice
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordseflectivity ; very low energy electros ; polyctystalline metal samples
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsTE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    GAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
    Institutional supportUPT-D - RVO:68081731
    AnnotationThe reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2014
Number of the records: 1