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Reflectivity of very low energy electrons from polycrystalline metal samples
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SYSNO ASEP 0422680 Document Type K - Proceedings Paper (Czech conf.) R&D Document Type The record was not marked in the RIV Title Reflectivity of very low energy electrons from polycrystalline metal samples Author(s) Pokorná, Zuzana (UPT-D) RID, ORCID, SAI Number of authors 1 Source Title Mikroskopie 2013. - Praha : Československá mikroskopická společnost, 2013
S. 9Number of pages 1 s. Publication form Print - P Action Mikroskopie 2013 Event date 13.05.2013-14.05.2013 VEvent location Lednice Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords eflectivity ; very low energy electros ; polyctystalline metal samples Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) Institutional support UPT-D - RVO:68081731 Annotation The reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2014
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