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Reflectivity of very low energy electrons from polycrystalline metal samples

SYSNO ASEP	0422680
Document Type	K - Proceedings Paper (Czech conf.)
R&D Document Type	The record was not marked in the RIV
Title	Reflectivity of very low energy electrons from polycrystalline metal samples
Author(s)	Pokorná, Zuzana (UPT-D)_{RID, ORCID, SAI}
Number of authors	1
Source Title	Mikroskopie 2013. - Praha : Československá mikroskopická společnost, 2013 S. 9
Number of pages	1 s.
Publication form	Print - P
Action	Mikroskopie 2013
Event date	13.05.2013-14.05.2013
VEvent location	Lednice
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	eflectivity ; very low energy electros ; polyctystalline metal samples
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
	GAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
Institutional support	UPT-D - RVO:68081731
Annotation	The reflectivity of very low energy electrons from the surfaces of both single crystal and polycrystalline aluminium and copper was measured in a Scanning Low Energy Electron Microscope in Ultra High Vacuum conditions. This metod alows for an ultra high resolution of the order of units of nanometers even at the lowest electron energies.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2014

Number of the records: 1