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Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM

SYSNO ASEP	0421779
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Ostatní články
Title	Characterization of Yeast Biofilm by Cryo-SEM and FIB-SEM
Author(s)	Hrubanová, Kamila (UPT-D)_{RID, SAI, ORCID} Nebesářová, Jana (BC-A)_{RID, ORCID} Růžička, F. (CZ) Dluhoš, J. (CZ) Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Number of authors	5
Source Title	Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276 Roč. 19, S2 (2013), s. 226-227
Number of pages	2 s.
Publication form	Print - P
Language	eng - English
Country	US - United States
Keywords	yeast biofilm ; cryo-SEM ; FIB-SEM
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	EE.2.3.20.0103 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
	GAP205/11/1687 GA ČR - Czech Science Foundation (CSF)
Institutional support	UPT-D - RVO:68081731 ; BC-A - RVO:60077344
DOI	10.1017/S1431927613003127
Annotation	Yeasts like Candida parapsilosis as well as Candida albicans has been recently recognized as an important cause of serious biofilm infections associated with implanted medical devices. The multi-layered biofilms formed by these microorganisms were observed by cryo-scanning electron microscope (cryo-SEM) with using freeze-fracturing technique and by focused ion beam scanning electron microscopy (FIB-SEM). Both imaging methods are compared.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2014

Number of the records: 1