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Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum
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SYSNO ASEP 0397636 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Mašek, B. (CZ)
Jirková, H. (CZ)
Aišman, D. (CZ)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 6 Source Title Applied Surface Science. - : Elsevier - ISSN 0169-4332
Roč. 275, 15 June (2013), s. 403-408Number of pages 6 s. Publication form Print - P Language eng - English Country NL - Netherlands Keywords Very low energy SEM ; Crystallographic contrast ; Strain mapping ; Semi-solid state processing Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) Institutional support UPT-D - RVO:68081731 UT WOS 000318977300062 EID SCOPUS 84877582579 DOI 10.1016/j.apsusc.2012.10.139 Annotation Progress in materials science is inseparably connected with development of new analytical methods which make possible to observe the materials microstructure with high sensitivity. The aim of the present study is shown that scanning low energy electron microscopy (SLEEM) has a significant impact in advance of a fundamental understanding of the evolution of microstructure upon semi-solid processing. This paper deals with the application of the ultra high vacuum scanning low energy electron microscopy (UHV SLEEM) to the study of microstructure of X210Cr12 steel after the formation in semi-solid state and the study of the annealing of deformed metastable austenite. Examples from these specimens show that the contrast between differently oriented grains in polycrystalline materials is very sensitive to the parameters such as energy of the primary beam, working distance and detection of high angle backscattered electrons. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2014
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