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Microstructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum

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    SYSNO ASEP0397636
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleMicrostructure of X210Cr12 steel after the forming in semi-solid state visualized by very low energy SEM in ultra high vacuum
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Mašek, B. (CZ)
    Jirková, H. (CZ)
    Aišman, D. (CZ)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Number of authors6
    Source TitleApplied Surface Science. - : Elsevier - ISSN 0169-4332
    Roč. 275, 15 June (2013), s. 403-408
    Number of pages6 s.
    Publication formPrint - P
    Languageeng - English
    CountryNL - Netherlands
    KeywordsVery low energy SEM ; Crystallographic contrast ; Strain mapping ; Semi-solid state processing
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsGAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
    Institutional supportUPT-D - RVO:68081731
    UT WOS000318977300062
    EID SCOPUS84877582579
    DOI10.1016/j.apsusc.2012.10.139
    AnnotationProgress in materials science is inseparably connected with development of new analytical methods which make possible to observe the materials microstructure with high sensitivity. The aim of the present study is shown that scanning low energy electron microscopy (SLEEM) has a significant impact in advance of a fundamental understanding of the evolution of microstructure upon semi-solid processing. This paper deals with the application of the ultra high vacuum scanning low energy electron microscopy (UHV SLEEM) to the study of microstructure of X210Cr12 steel after the formation in semi-solid state and the study of the annealing of deformed metastable austenite. Examples from these specimens show that the contrast between differently oriented grains in polycrystalline materials is very sensitive to the parameters such as energy of the primary beam, working distance and detection of high angle backscattered electrons.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2014
Number of the records: 1  

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