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Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films
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SYSNO ASEP 0392014 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films Author(s) Aulika, I. (IT)
Mergen, S. (AU)
Bencan, A. (SI)
Zhang, Q. (GB)
Dejneka, Alexandr (FZU-D) RID, ORCID
Kosec, M. (SI)
Kundzins, K. (LT)
Demarchi, D. (IL)
Civera, P. (IT)Source Title Advances in Applied Ceramics . - : Taylor & Francis - ISSN 1743-6753
Roč. 112, č. 1 (2013), s. 53-58Number of pages 6 s. Language eng - English Country GB - United Kingdom Keywords compositional and optical gradien ; PZT ; spectroscopic ellipsometry ; crystallisation proces ; sol-gel ; XRD ; thin films ; depth profile ; spectroscopic elipsometry Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects TA01010517 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) GAP108/12/1941 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000314664100008 DOI 10.1179/1743676112Y.0000000019 Annotation This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2014
Number of the records: 1