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Atomic Force Microscopy Investigations into Biology - From Cell to Protein

  1. 1.
    SYSNO ASEP0390150
    Document TypeM - Monograph Chapter
    R&D Document TypeMonograph Chapter
    TitleArtifacts in atomic force microscopy of biological samples
    Author(s) Ukraintsev, Egor (FZU-D) RID, ORCID
    Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Kozak, Halyna (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Rezek, Bohuslav (FZU-D) RID, ORCID
    Source TitleAtomic Force Microscopy Investigations into Biology - From Cell to Protein. - Rijeka : InTech, 2012 / Frewin C.L. - ISBN 978-953-51-0114-7
    Pagess. 29-54
    Number of pages26 s.
    Number of pages354
    Publication formPrint - P
    Languageeng - English
    CountryHR - Croatia
    Keywordsatomic force microscopy (AFM) ; validity of measurement ; accuracy of measurement
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsLC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    DOI10.5772/2092
    AnnotationAtomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2013
Number of the records: 1  

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