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Optical methods for the evaluation of lanthanide excited state thermal ionization barrier in luminescent materials

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    SYSNO ASEP0389571
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleOptical methods for the evaluation of lanthanide excited state thermal ionization barrier in luminescent materials
    Author(s) Fasoli, M. (IT)
    Vedda, A. (IT)
    Mihóková, Eva (FZU-D) RID, ORCID, SAI
    Nikl, Martin (FZU-D) RID, ORCID, SAI
    Source TitlePhysical Review. B - ISSN 1098-0121
    Roč. 85, č. 8 (2012), "085127-1"-"085127-8"
    Number of pages8 s.
    Languageeng - English
    CountryUS - United States
    KeywordsLu2Si2O7 ; Pr-doped ; luminescence ; scintillator ; excited state ionization
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsKAN300100802 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    ME10084 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    UT WOS000300831900004
    DOI10.1103/PhysRevB.85.085127
    AnnotationWe improve a recently proposed approach for the evaluation of the thermal ionization barrier of the lanthanide excited states in luminescent materials by taking into account the effect of traps and their decay time temperature dependence. We present two distinct methods, and we apply them to the case of Lu2Si2O7:Pr. To this purpose, wavelength resolved thermally stimulated luminescence and photoluminescence time decay measurements extending up to the ms time scale have been performed.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2013
Number of the records: 1  

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