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The Use of Ion Microprobe to Study of Properties of Irradiated Solids

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    SYSNO ASEP0389337
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleThe Use of Ion Microprobe to Study of Properties of Irradiated Solids
    Author(s) Peřina, Vratislav (UJF-V) RID
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Jurek, Karel (FZU-D) RID, ORCID, SAI
    Gedeon, O. (CZ)
    Number of authors4
    Source TitleMikroskopie 2012. - Praha : Československá mikroskopická společnost, 2012
    Number of pages1 s.
    Publication formPrint - P
    ActionMikroskopie 2012
    Event date17.04.2012-18.04.2012
    VEvent locationBratislava
    CountrySK - Slovakia
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsion beam ; irradiation ; Tandetron
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    R&D ProjectsGA104/09/1269 GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271 ; UJF-V - RVO:61389005
    AnnotationAn ion-microbeam setup (based on Oxford Microbeams components: quadrupole triplet, scanning coils, QMDAQ2007 acquisition system) have been installed at 3MV Tandetron accelerator at the NPI of ASCR in Rez. The system allows focusing light ions (as H, He, C, O, Si) down to the beam spot size of 1μm2. The ion currents can be adjusted from few ions/s-1 up to few hundreds of pA. The microbeam is used for ion beam elemental and structural analysis of materials using the RBS, PIXE, STIM methods and for the modification and micro fabrication of materials using direct ion beam writing technique. We present an example of the study of potassium silicate glass modification by 1.5 MeV proton beam irradiation. The purpose is to supplement similar investigation of changes in glass structure and properties caused by electrons irradiation. Glass sample was irradiated at defined positions by the doses ranged from 4 to 300 C/m2 at 60x60 μm2 area and the beam current under 100pA in order to minimize the sample heating.The irradiation time dwell from minutes up to few hours. The topography of irradiated spots was investigated with the AFM microscopy at IP ASCR, and the surface depression and roughness were derived. The possible composition changes during irradiation were monitoring by RBS and PIXE. The function of topological response on absorbed doses (in terms of total volume absorbed energy) is similar for protons and electrons. However, contrary to electrons, protons cased almost no elemental composition changes and no sign of increased volume after high dose irradiation.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2013
Number of the records: 1  

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