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Optical study of defects in nanodiamond films grown in linear antenna microwave plasma CVD from H.sub.2./sub./CH.sub.4./sub./CO.sub.2./sub. gas mixture

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    SYSNO ASEP0388439
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleOptical study of defects in nanodiamond films grown in linear antenna microwave plasma CVD from H2/CH4/CO2 gas mixture
    Author(s) Varga, Marián (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Babchenko, Oleg (FZU-D) RID, ORCID
    Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Source TitlePhysica Status Solidi B : Basic Solid State Physics. - : Wiley - ISSN 0370-1972
    Roč. 249, č. 12 (2012), s. 2635-2639
    Number of pages5 s.
    Languageeng - English
    CountryDE - Germany
    Keywordsnanocrystalline diamond ; optical spectroscopy ; wide band gap semiconductors ; pulsed linear plasma CVD
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsGAP108/11/0794 GA ČR - Czech Science Foundation (CSF)
    GAP205/12/0908 GA ČR - Czech Science Foundation (CSF)
    LH12236 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    UT WOS000312215300079
    DOI10.1002/pssb.201200154
    AnnotationWe present the study on optical quality of nanocrystalline diamond (NCD) films with submicron grain size grown from H2/CH4/CO2 gas mixture on alkali-free borosilicate glass substrates using the commercially available large area linear antenna pulsed microwave plasma chemical vapor deposition (CVD) system. The NCD films were characterized by Raman spectroscopy, atomic force microscopy, and scanning electron microscopy. The NCD layers are optically transparent and show low optical scattering. The defect states measured by photo-thermal deflection spectroscopy (PDS) and dual beam photocurrent spectroscopy (DBPS) are dominated by the non-diamond carbon phases localized at grain boundaries with the characteristic shape of the optical absorption spectrum and the photo-ionization threshold in a near infrared region. The sp2-related defect density increases for samples grown at higher pressure. From DBPS we estimate the concentration of substitutional nitrogen to be below 10 ppm. The optimized NCD layers show the photoionization threshold in UV region above 5 eV and a broad exponential tail below 5 eV.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2013
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