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Effect of sample tilt on PEEM resolution
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SYSNO ASEP 0385323 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Effect of sample tilt on PEEM resolution Author(s) Oral, Martin (UPT-D) RID, ORCID, SAI
Radlička, Tomáš (UPT-D) RID, ORCID, SAI
Lencová, B. (CZ)Number of authors 3 Source Title Ultramicroscopy. - : Elsevier - ISSN 0304-3991
Roč. 119, S1 (2012), s. 45-50Number of pages 6 s. Language eng - English Country NL - Netherlands Keywords PEEM ; LEEM ; Aberrations ; Misalignment ; Sample tilt ; Point spread function ; Resolution Subject RIV BH - Optics, Masers, Lasers R&D Projects IAA100650805 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) Institutional support UPT-D - RVO:68081731 UT WOS 000308079200008 EID SCOPUS 84865352017 DOI 10.1016/j.ultramic.2011.11.011 Annotation In electron microscopy design, the systems are usually assumed to be perfectly aligned or that possible small imperfections can be eliminated by simple multipole correctors (centering deflectors, stigmators) without loss of resolution. However, in some cases, like in the cathode lens between the sample and the objective lens in the photoemission electron microscope, even a small imperfection can impair the resolution significantly. Because of the strong field between the sample and the objective lens, even a small tilt of the sample generates a parasitic dipole field, which decreases resolution and causes image deformations. We present a simulation of the influence of a small sample tilt on the system resolution based on modern computational methods that enable simulation of the whole system including the parasitic fields, proper setting of centering deflectors and stigmators. The resolution is determined by simulating the point spread function and finding the size of its significant part. The procedure is shown on realistic data from the literature. We found out that the resolution becomes worse mainly in the direction of the parasitic dipole field. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2013
Number of the records: 1