Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion

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SYSNO ASEP	0379852
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Comparison of optical models and signals from XPS and VASE characterized titanium after PBS immersion
Author(s)	Penttinen, N. (FI) Hasoň, Stanislav (BFU-R)_{RID, ORCID} Silvennoinen, M. (FI) Joska, L. (CZ) Silvennoinen, R. (FI)
Number of authors	5
Source Title	Optics Communications. - : Elsevier - ISSN 0030-4018 Roč. 285, č. 6 (2012), s. 965-968
Number of pages	4 s.
Language	eng - English
Country	NL - Netherlands
Keywords	permittivity ; XPS titanium ; diffractive optical element-based sensor
Subject RIV	BO - Biophysics
CEZ	AV0Z50040507 - BFU-R (2005-2011)
	AV0Z50040702 - BFU-R (2007-2013)
UT WOS	000301159800020
DOI	10.1016/j.optcom.2011.11.080
Annotation	A reflection models from a XPS characterized titanium surface were calculated using Bruggeman's model. These models were tested in a diffractive optical element-based sensor measurements, while the samples were immersed in a phosphate buffered saline solution. A second reflectance model of a material thickness on a titanium surface was conducted, to further evaluate the reflectance information gathered with diffractive optical element-based sensor.
Workplace	Institute of Biophysics
Contact	Jana Poláková, polakova@ibp.cz, Tel.: 541 517 244
Year of Publishing	2013

Number of the records: 1