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Scanning Very Low Energy Electron Microscopy
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SYSNO ASEP 0368827 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Scanning Very Low Energy Electron Microscopy Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Hovorka, Miloš (UPT-D)
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
Mikmeková, Eliška (UPT-D) RID
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 6 Source Title NANOCON 2011. 3rd International Conference. - Ostrava : Tanger spol. s r. o, 2011 - ISBN 978-80-87294-27-7 Pages s. 238-243 Number of pages 6 s. Action NANOCON 2011. International Conference /3./ Event date 21.09.2011-23.09.2011 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords scanning electron microscopy ; low energy electrons ; grain contrast ; transmitted electrons ; dopant contrast ; thin films Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) IAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z20650511 - UPT-D (2005-2011) UT WOS 000306686700035 Annotation Recent developments in applications of the scanning very low energy electron microscopy in selected branches of materials science are reviewed. The examples include visualization of grains in conductive polycrystals including ultrafine grained metals, identification of the local crystal orientation upon reflectance of very slow electrons, transmission mode with ultrathin free-standing films including graphene, acquisition of a quantitative dopant contrast in semiconductors, and examination of thin surface coverages. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2012
Number of the records: 1