Number of the records: 1

Standing Wave Interferometer with Stabilization of Wavelength on Air

SYSNO ASEP	0368388
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Standing Wave Interferometer with Stabilization of Wavelength on Air
Author(s)	Lazar, Josef (UPT-D)_{RID, ORCID, SAI} Číp, Ondřej (UPT-D)_{RID, SAI, ORCID} Čížek, Martin (UPT-D)_{RID, ORCID, SAI} Hrabina, Jan (UPT-D)_{RID, ORCID, SAI} Buchta, Zdeněk (UPT-D)_{RID, SAI, ORCID}
Number of authors	5
Source Title	tm-Technisches Messen - ISSN 0171-8096 Roč. 78, č. 11 (2011), s. 484-488
Number of pages	5 s.
Language	eng - English
Country	DE - Germany
Keywords	refractometry ; nanopositioning ; interferometry ; nanometrology
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	GA102/09/1276 GA ČR - Czech Science Foundation (CSF)
	GPP102/11/P820 GA ČR - Czech Science Foundation (CSF)
	KAN311610701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000297711400002
EID SCOPUS	80055095667
DOI	10.1524/teme.2011.0201
Annotation	We present an experimental arrangement of an interferometric system designed to operate with full compensation for varying refractive index of air in the measuring axis. The concept is based on a principle where the wavelength of the laser source is derived not from an optical frequency of the stabilized laser but from a fixed length being a base-plate or a frame of the whole measuring setup. This results into stabilization of the wavelength of the laser source in atmospheric conditions to mechanical length of suitable etalon made of a material with very low thermal expansion. The ultra-low thermal expanding glass ceramic materials available on the market perform thermal expansion coefficients on the level 10-8 which significantly exceeds the limits of uncertainty posed by indirect evaluation of refractive index of air through Edlen formula. This approach represents a contribution primarily to high-resolution and high-precision dimensional metrology in the nanoscale.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2012

Number of the records: 1