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Sub-Nanometer Scale Temperature Distance Change Monitor by Optical Frequency Comb Referenced to the Atomic Clock

SYSNO ASEP	0368253
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Sub-Nanometer Scale Temperature Distance Change Monitor by Optical Frequency Comb Referenced to the Atomic Clock
Author(s)	Šmíd, Radek (UPT-D)_{RID, SAI} Číp, Ondřej (UPT-D)_{RID, SAI, ORCID} Čížek, Martin (UPT-D)_{RID, ORCID, SAI} Buchta, Zdeněk (UPT-D)_{RID, SAI, ORCID} Lazar, Josef (UPT-D)_{RID, ORCID, SAI}
Number of authors	5
Source Title	Proceedings of the 20th IMEKO TC2 Symposium on Photonics in Measurement. - Aachen : Shaker Verlag, 2011 - ISBN 978-3-8440-0058-0
Pages	s. 130-133
Number of pages	4 s.
Action	IMEKO TC2 Symposium on Photonics in Measurement /20./
Event date	16.05.2011-18.05.2011
VEvent location	Linz
Country	AT - Austria
Event type	WRD
Language	eng - English
Country	DE - Germany
Keywords	length measurement ; interferometry ; nanoscale changes ; optical frequency comb
Subject RIV	BH - Optics, Masers, Lasers
R&D Projects	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	2C06012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	2A-1TP1/127 GA MPO - Ministry of Industry and Trade (MPO)
	FT-TA3/133 GA MPO - Ministry of Industry and Trade (MPO)
	2A-3TP1/113 GA MPO - Ministry of Industry and Trade (MPO)
	GA102/09/1276 GA ČR - Czech Science Foundation (CSF)
	GA102/07/1179 GA ČR - Czech Science Foundation (CSF)
	GAP102/10/1813 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Annotation	In this work we present a method of monitor of small distance changes in the sub-nanometer order. The method uses a Fabry-Perot cavity of Zerodur spacer. It’s length is monitored by a selected mode of the femtosecond frequency comb is locked to certain mode of the optical cavity. Measured cavity is placed into temperature stabilized vacuum chamber. Temperature changes affects the length of the cavity, hence the change in repetition frequency of the femtosecond comb. The first results shows the resolution of the method in the order of 0.1 nm.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2012

Number of the records: 1