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Thin dielectric resonators for microwave characterization of films and substrates
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SYSNO ASEP 0368068 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Thin dielectric resonators for microwave characterization of films and substrates Author(s) Bovtun, Viktor (FZU-D) RID, ORCID, SAI
Pashkov, V. (UA)
Kempa, Martin (FZU-D) RID, ORCID
Molchanov, V. (UA)
Kamba, Stanislav (FZU-D) RID, ORCID, SAI
Poplavko, Y. (UA)
Yakymenko, Y. (UA)Source Title Microwave and Telecommunication Technology (CriMiCo) 2011. 21th International Crimean Conference. - Sevastopol : Veber, 2011 / Ermolov P.P. - ISBN 978-966-335-351-7 Pages s. 620-621 Number of pages 2 s. Action International Crimean Conference "Microwave and Telecommunication Technology" /21./ (CriMiCo´2011) Event date 12.09.2011-16.09.2011 VEvent location Sevastopol Country UA - Ukraine Event type WRD Language eng - English Country UA - Ukraine Keywords microwave dielectric properties ; thin film ; dielectric resonator Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z10100520 - FZU-D (2005-2011) Annotation Thin dielectric resonator consisting only of the low-loss dielectric substrate and deposited film is proposed for the electrode-free microwave characterization of thin films and substrates. In-plane microwave dielectric parameters of a number of substrates and thin films were measured in a broad temperature range using the TE01δ resonance mode. Dielectric anomalies corresponding to the induced phase transitions were observed. The HE11δ mode is proposed for the in-plane dielectric anisotropy characterization. The anisotropy of the (110) DyScO3 substrate was measured. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
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