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Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass
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SYSNO ASEP 0368047 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Solid State Field-Assisted Diffusion of Copper in Multi-Component Tellurite Glass Author(s) Stepanov, B. (RU)
Ren, J. (CN)
Wágner, T. (CZ)
Lorinčík, Jan (URE-Y)
Frumar, M. (CZ)
Churbanov, M. (RU)
Chigirinsky, Y. (RU)Number of authors 7 Source Title Journal of the American Ceramic Society. - : Wiley - ISSN 0002-7820
Roč. 94, č. 7 (2011), 1986-1988Number of pages 3 s. Language eng - English Country US - United States Keywords Solid state diffusion ; Secondary Ion Mass Spectrometry ; Tellurite glass Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering CEZ AV0Z20670512 - URE-Y (2005-2011) UT WOS 000292606600007 DOI 10.1111/j.1551-2916.2011.04606.x Annotation Copper doped multi-component tellurite glasses were prepared by solid state electric field assisted diffusion. The concentration profiles of the elements have been measured by the secondary ion mass spectrometry. The depth profile of copper can be well fitted only by a modified erfc-like solution of the second Fick’s law, which assumes that both Cu+ and Cu2+ ions are involved in the diffusion. The modeling shows that the Cu2+ ions are much more mobile than the Cu+ ones in the tellurite glasses and affected strongly by the applied electric field. Our results demonstrate the possibility of fabrication of copper doped planar waveguides based on the tellurite glasses. Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2012
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