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Strain Mapping by Scanning Low Energy Electron Microscopy
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SYSNO ASEP 0367893 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Strain Mapping by Scanning Low Energy Electron Microscopy Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Man, O. (CZ)
Pantělejev, L. (CZ)
Hovorka, Miloš (UPT-D)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCID
Kouřil, M. (CZ)Number of authors 7 Source Title Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). - Zurich : Trans Tech Publications, 2011 / Šandera P. - ISSN 1662-9795 - ISBN 978-3-03785-006-0 Pages s. 338-341 Number of pages 4 s. Action MSMF-6: Materials Structure and Micromechanics of Fracture VI Event date 28.06.2010-30.06.2010 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CH - Switzerland Keywords scanning low energy electron microscopy (SLEEM) ; contrast of crystal orientation ; microscopic strain Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects IAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z20650511 - UPT-D (2005-2011) UT WOS 000291704700077 DOI 10.4028/www.scientific.net/KEM.465.338 Annotation The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2012
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