Number of the records: 1  

Strain Mapping by Scanning Low Energy Electron Microscopy

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    SYSNO ASEP0367893
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleStrain Mapping by Scanning Low Energy Electron Microscopy
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Man, O. (CZ)
    Pantělejev, L. (CZ)
    Hovorka, Miloš (UPT-D)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Kouřil, M. (CZ)
    Number of authors7
    Source TitleMaterials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). - Zurich : Trans Tech Publications, 2011 / Šandera P. - ISSN 1662-9795 - ISBN 978-3-03785-006-0
    Pagess. 338-341
    Number of pages4 s.
    ActionMSMF-6: Materials Structure and Micromechanics of Fracture VI
    Event date28.06.2010-30.06.2010
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCH - Switzerland
    Keywordsscanning low energy electron microscopy (SLEEM) ; contrast of crystal orientation ; microscopic strain
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    R&D ProjectsIAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    UT WOS000291704700077
    DOI10.4028/www.scientific.net/KEM.465.338
    AnnotationThe use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2012
Number of the records: 1  

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