Number of the records: 1
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.
SYSNO ASEP 0366182 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates Author(s) Holovský, Jakub (FZU-D) RID, ORCID
Dagkaldiran, U. (DE)
Remeš, Zdeněk (FZU-D) RID, ORCID
Purkrt, Adam (FZU-D) RID
Ižák, Tibor (FZU-D) RID
Poruba, Aleš (FZU-D) RID
Vaněček, Milan (FZU-D) RIDSource Title Physica Status Solidi A : Applications and Materials Science. - : Wiley - ISSN 1862-6300
Roč. 207, č. 9 (2010), s. 578-581Number of pages 4 s. Language eng - English Country DE - Germany Keywords solar cell ; silicon ; spectroscopy Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GD202/09/H041 GA ČR - Czech Science Foundation (CSF) GA202/09/0417 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000276339800017 DOI 10.1002/pssa.200982890 Annotation Fourier transform photocurrent spectroscopy(FTPS)is used as an inspection method for hydrogenated amorphous silicon(a-Si:H)thin films deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll-to-roll solar cell fabrication process. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2015
Number of the records: 1