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Advanced X-ray radiography and tomography in several engineering applications
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SYSNO ASEP 0365111 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Advanced X-ray radiography and tomography in several engineering applications Author(s) Vavřík, Daniel (UTAM-F) RID, SAI, ORCID
Dammer, J. (CZ)
Jakůbek, J. (CZ)
Jeon, I. (KR)
Jiroušek, Ondřej (UTAM-F) RID, SAI
Kroupa, M. (CZ)
Zlámal, Petr (UTAM-F) RID, SAI, ORCIDNumber of authors 7 Source Title Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
Roč. 633, č. 1 (2011), s. 152-155Number of pages 4 s. Publication form www - www Action International workshop on radiation imaging detectors /11./ Event date 26.06.2009-02.07.2009 VEvent location Praha Country CZ - Czech Republic Event type WRD Language eng - English Country NL - Netherlands Keywords digital radiography ; computed tomography ; X-ray crack imaging Subject RIV JL - Materials Fatigue, Friction Mechanics R&D Projects GA103/09/2101 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20710524 - UTAM-F (2005-2011) UT WOS 000292782400046 EID SCOPUS 79959847779 DOI 10.1016/j.nima.2010.06.152 Annotation New developments in the fields of X-ray detectors, X-ray micro/nano sources and data processing bring new possibilities for engineering practice in many applications. Nowadays it is possible to observe an object, which was difficult to image before due to limitations such as low contrast, low dynamic range, low attenuation and/or small structural dimensions. A number of compelling problems in different applications are summarized. Digital radiograms in this work are acquired using micro- and nano-focus X-ray tubes together with semiconductor digital pixelated detectors. A beam hardening correction was done for relevant radiograms and an iterative OSEM (ordered subsets) method was applied for CT reconstructions. Workplace Institute of Theoretical and Applied Mechanics Contact Kulawiecová Kateřina, kulawiecova@itam.cas.cz, Tel.: 225 443 285 Year of Publishing 2012
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