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Comparing different approaches to characterization of focused X-ray laser beams
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SYSNO ASEP 0361433 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Comparing different approaches to characterization of focused X-ray laser beams Author(s) Chalupský, Jaromír (FZU-D) RID, ORCID
Boháček, Pavel (FZU-D) RID, ORCID, SAI
Hájková, Věra (FZU-D) RID, ORCID
Hau-Riege, S.P. (US)
Heimann, P.A. (US)
Juha, Libor (FZU-D) RID, ORCID, SAI
Krzywinski, J. (US)
Messerschmidt, M. (US)
Moeller, S.P. (US)
Nagler, B. (US)
Rowen, M. (US)
Schlotter, W.F. (US)
Swiggers, M.L. (US)
Turner, J.J. (US)Source Title Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
Roč. 631, č. 1 (2011), s. 130-133Number of pages 4 s. Language eng - English Country NL - Netherlands Keywords X-ray laser ; X-ray ablation ; beam focusing ; beam characterization ; beam profile measurement Subject RIV BH - Optics, Masers, Lasers R&D Projects KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GAP208/10/2302 GA ČR - Czech Science Foundation (CSF) LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) ME10046 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100523 - FZU-D (2005-2011) UT WOS 000288042100020 DOI 10.1016/j.nima.2010.12.040 Annotation X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of substantial importance for the purposes of the experiments being conducted at these sources. A profound knowledge of the spatial, temporal, spectral, statistical, coherence, and wavefront beam properties may protect us from an unwanted misinterpretation of the experimental data. We present an experimental technique of the spatial (transverse and longitudinal) characterization of the beam profile. Investigating ablative imprints in various materials, we evaluate the spatial properties of the incident beam, namely, the beam waist radius and position, the Rayleigh range, M-2 parameter, and divergence. In this paper, we recall briefly our recent work at the transverse beam profile reconstruction. A newly developed method of the longitudinal beam profile characterization is the main subject of this work. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
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