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Clay pigment structure characterisation as a guide for provenance determination-a comparison between laboratory powder micro-XRD and synchrotron radiation XRD

  1. 1.
    SYSNO ASEP0359641
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleClay pigment structure characterisation as a guide for provenance determination-a comparison between laboratory powder micro-XRD and synchrotron radiation XRD
    Author(s) Švarcová, Silvie (UACH-T) SAI, RID, ORCID
    Bezdička, Petr (UACH-T) SAI, RID, ORCID
    Hradil, David (UACH-T) RID, SAI
    Hradilová, J. (CZ)
    Žižak, I. (DE)
    Source TitleAnalytical and Bioanalytical Chemistry. - : Springer - ISSN 1618-2642
    Roč. 399, č. 1 (2011), s. 331-336
    Number of pages6 s.
    Languageeng - English
    CountryDE - Germany
    Keywordspowder X-ray micro-diffraction ; kaolinite ; pigment provenance
    Subject RIVCA - Inorganic Chemistry
    CEZAV0Z40320502 - UACH-T (2005-2011)
    UT WOS000285781200030
    DOI10.1007/s00216-010-4382-4
    AnnotationApplication of X-ray diffraction (XRD) based techniques in analysis of painted artworks is not only beneficial for indisputable identification of crystal constituents in colour layers but it can also bring insight in material crystal structure, which can be affected by their geological formation, manufacturing procedure or secondary changes. This knowledge might be helpful for art historic evaluation of an artwork as well as its conservation. By way of example of kaolinite we show that classification of its crystal structure order based on XRD data is useful for estimation of its provenance. We found kaolinite in the preparation layer of a Gothic wall painting in a Czech church situated near Karlovy Vary, where are important kaolin deposits. Comparing reference kaolin materials from eight various Czech deposits we found that these can be differentiate just according to the kaolinite crystallinity. Within this study we compared laboratory powder X-ray micro-diffraction (micro-XRD) with synchrotron radiation X-ray diffraction (SR-XRD) analysing the same real sample. We found that both techniques led to the same results.
    WorkplaceInstitute of Inorganic Chemistry
    ContactJana Kroneislová, krone@iic.cas.cz, Tel.: 311 236 931
    Year of Publishing2012
Number of the records: 1  

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