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InAs/GaAs quantum dot capping in kinetically limited MOVPE growth regime
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SYSNO ASEP 0359526 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title InAs/GaAs quantum dot capping in kinetically limited MOVPE growth regime Author(s) Hospodková, Alice (FZU-D) RID, ORCID, SAI
Pangrác, Jiří (FZU-D) RID, ORCID, SAI
Vyskočil, Jan (FZU-D) RID
Oswald, Jiří (FZU-D) RID, ORCID
Vetushka, Aliaksi (FZU-D) RID, ORCID
Caha, O. (CZ)
Hazdra, P. (CZ)
Kuldová, Karla (FZU-D) RID, ORCID
Hulicius, Eduard (FZU-D) RID, ORCID, SAISource Title Journal of Crystal Growth. - : Elsevier - ISSN 0022-0248
Roč. 317, č. 1 (2011), s. 39-42Number of pages 4 s. Language eng - English Country NL - Netherlands Keywords low dimensional structures ; photoluminescence ; low-pressure MOVPE ; InAs/GaAs quantum dots ; semiconducting III–V materials Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GAP102/10/1201 GA ČR - Czech Science Foundation (CSF) GAP108/10/0253 GA ČR - Czech Science Foundation (CSF) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA202/09/0676 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100521 - FZU-D (2005-2011) UT WOS 000288837700008 DOI 10.1016/j.jcrysgro.2010.12.076 Annotation InAs/GaAs quantum dot(QD)properties can be significantly influenced by the growth conditions of the QD capping layer. We have studied the effect of a group III partial pressure in the reactor on the QD capping process and on the QD photoluminescence when the capping layer is grow nunder the kinetically limited regime. Two types of capping layers were prepared: GaAs and InGaAs. The GaAs capping layer growth rate decrease did not influence QD dissolution, but increased the dissolution of big hillocks. Influence of the GaAs capping layer thickness on QD photoluminescence is also demonstrated. The composition of the ternary strain reducing InGaAs capping layer can beconsiderably changed depending on the V/III ratio under kinetically limited growth. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2012
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