Number of the records: 1  

Spot size characterization of focused non-Gaussian X-ray laser beams

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    SYSNO ASEP0359300
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleSpot size characterization of focused non-Gaussian X-ray laser beams
    Author(s) Chalupský, Jaromír (FZU-D) RID, ORCID
    Krzywinski, J. (US)
    Juha, Libor (FZU-D) RID, ORCID, SAI
    Hájková, Věra (FZU-D) RID, ORCID
    Cihelka, Jaroslav (FZU-D)
    Burian, Tomáš (FZU-D) RID, ORCID
    Vyšín, Luděk (FZU-D) RID, ORCID
    Gaudin, J. (DE)
    Gleeson, A. (GB)
    Jurek, M. (PL)
    Khorsand, A.R. (NL)
    Klinger, D. (PL)
    Wabnitz, H. (DE)
    Sobierajski, R. (PL)
    Störmer, M. (DE)
    Tiedtke, K. (DE)
    Toleikis, S. (DE)
    Source TitleOptics Express. - : Optical Society of America - ISSN 1094-4087
    Roč. 18, č. 26 (2010), s. 27836-27845
    Number of pages10 s.
    Languageeng - English
    CountryUS - United States
    KeywordsX-ray laser ; free-electron laser ; beam characterization ; ablation
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsKAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GAP208/10/2302 GA ČR - Czech Science Foundation (CSF)
    LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    ME10046 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z10100523 - FZU-D (2005-2011)
    UT WOS000285584200115
    DOI10.1364/OE.18.027836
    AnnotationWe present a new technique for the characterization of non-Gaussian laser beams which cannot be described by an analytical formula. As a generalization of the beam spot area we apply and refine the definition of so called effective area (A(eff)) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which is inappropriate for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft X-ray free-electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination are presented in this work. An F-scan method, newly developed in this paper, appears to be a good candidate for the spatial beam diagnostics applicable to lasers of various kinds.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2012
Number of the records: 1  

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