Number of the records: 1

Development of EOD for the design in electron and ion microscopy

SYSNO ASEP	0358560
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Development of EOD for the design in electron and ion microscopy
Author(s)	Zlámal, J. (CZ) Lencová, Bohumila (UPT-D)_{RID, SAI}
Number of authors	2
Source Title	Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002 Roč. 654, č. 1 (2011), s. 278-282
Number of pages	5 s.
Language	eng - English
Country	NL - Netherlands
Keywords	finite element method ; tolerancing ; user interface
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	IAA100650805 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
UT WOS	000292713900053
DOI	10.1016/j.nima.2010.12.198
Annotation	The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2012

Number of the records: 1