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Contact system of solid state surface mapping
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SYSNO ASEP 0356357 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Contact system of solid state surface mapping Author(s) Hiklová, Helena (FZU-D) RID
Havelková, Martina (FZU-D) RID, ORCID
Chmelíčková, Hana (FZU-D) RID
Lapšanská, Hana (FZU-D)Source Title Experimental Stress Analysis 2010. - Olomouc : Palacky University, 2010 / Šmíd P. ; Horváth P. ; Hrabovský M. - ISBN 978-80-244-2533-7 Pages s. 89-93 Number of pages 5 s. Action International Scientific Conference Experimental Stress Analysis 2010 /48./ Event date 31.05.2010-03.06.2010 VEvent location Velké Losiny Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords contact sensing ; contact profilometer ; 3D imaging of solid surfaces Subject RIV BH - Optics, Masers, Lasers R&D Projects KAN301370701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) 1M06002 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000283463400012 Annotation The advantages of contact solid state surface mapping are reminded in this paper. Some possibilities are demonstrated by several examples. These examples include measuring of laser beam treated silicon surface and mapping of laser cuts in metal sheets. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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