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Similarities and differences between spatial coherence profilometry and white-light interferometry

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    SYSNO ASEP0355851
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleSimilarities and differences between spatial coherence profilometry and white-light interferometry
    Author(s) Pavlíček, Pavel (FZU-D) RID, ORCID, SAI
    Takeda, M. (JP)
    Source TitleSimilarities and Differences between Spatial Coherence Profilometry and White-light Interferometry. - Melville, New York : AIP, 2010 / Hack E. ; Rastogi P.K. - ISBN 978-0-7354-0783-1
    Pagess. 161-166
    Number of pages6 s.
    ActionInternational Conference on Advanced Phase Measurement Methods in Optics and Imaging
    Event date16.05.2010-21.05.2010
    VEvent locationAscona
    CountryCH - Switzerland
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordswhite-light interferometry ; spatial coherence profilometry ; shape measurement
    Subject RIVBH - Optics, Masers, Lasers
    R&D ProjectsKAN301370701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z10100522 - FZU-D (2005-2011)
    UT WOS000283749400027
    AnnotationSpatial coherence profilometry is a method that uses a Michelson interferometer illuminated by a quasi-monochromatic spatially extended light source to measure the shape of objects. Because of the spatially extended light source, this method takes advantage of spatial coherence of the light. Thus spatial coherence profilometry appears to be a spatial coherence analogy to white-light interferometry which is a reliable and proved method for the measurement of the shape of objects. White-light interferometry usually uses a Michelson interferometer illuminated by a polychromatic point-like light source and so is based on temporal coherence. Though these both measurement methods look similar they show some significant differences. By means of theoretical analysis and experiments we investigate what is similar and where are the differences between these both methods.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2011
Number of the records: 1  

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