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Comparison between chemical and plasmatic treatment of seeding layer for patterned diamond growth
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SYSNO ASEP 0355161 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Comparison between chemical and plasmatic treatment of seeding layer for patterned diamond growth Author(s) Kromka, Alexander (FZU-D) RID, ORCID, SAI
Babchenko, Oleg (FZU-D) RID, ORCID
Rezek, Bohuslav (FZU-D) RID, ORCID
Hruška, Karel (FZU-D) RID, ORCID
Purkrt, A. (CZ)
Remeš, Zdeněk (FZU-D) RID, ORCIDNumber of authors 6 Source Title Diamond Electronics and Bioelectronics - Fundamentals to Applications III. - Warrendale, PA : Materials Research Society, 2010 / Bergonzo P. ; Butler J.E. ; Jackman R.B. ; Loh K.P. ; Nesladek M. - ISBN 978-1-60511-176-6 Pages s. 137-143 Number of pages 7 s. Action MRS Fall Meeting 2009 Event date 30.11.2009-04.12.2009 VEvent location Boston Country US - United States Event type WRD Language eng - English Country US - United States Keywords diamond ; plasma-enhanced CVD (PECVD) (deposition) ; microstructure Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAAX00100902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) KAN400480701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100521 - FZU-D (2005-2011) Annotation We employ UV photolithographic and electron beam lithographic patterning of diamond seeding layer on SiO2/Si substrates for the selective growth of micrometer and sub-micrometer diamond patterns. Using bottom-up strategy, thin diamond channels (470 nm in width) are directly grown. Differences between wet chemical and plasma treatment on the patterned diamond growth are studied. We find that the density of parasitic diamond crystals (outside predefined patterns) is lowered for gas mixture CF4/O2 plasma than for rich O2 plasma. After CF4/O2 plasma treatment, the density of parasitic crystals is 106 cm-2 which is comparable to the wet chemical treatment. Introducing sandwich-like structure, i.e. photoresist-seeding layer-photoresist, and its treatment (lift-off and CF4/O2 plasma) further reduces the density of parasitic crystals down to 105 cm-2. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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