Number of the records: 1  

Comparison between chemical and plasmatic treatment of seeding layer for patterned diamond growth

  1. 1.
    SYSNO ASEP0355161
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleComparison between chemical and plasmatic treatment of seeding layer for patterned diamond growth
    Author(s) Kromka, Alexander (FZU-D) RID, ORCID, SAI
    Babchenko, Oleg (FZU-D) RID, ORCID
    Rezek, Bohuslav (FZU-D) RID, ORCID
    Hruška, Karel (FZU-D) RID, ORCID
    Purkrt, A. (CZ)
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Number of authors6
    Source TitleDiamond Electronics and Bioelectronics - Fundamentals to Applications III. - Warrendale, PA : Materials Research Society, 2010 / Bergonzo P. ; Butler J.E. ; Jackman R.B. ; Loh K.P. ; Nesladek M. - ISBN 978-1-60511-176-6
    Pagess. 137-143
    Number of pages7 s.
    ActionMRS Fall Meeting 2009
    Event date30.11.2009-04.12.2009
    VEvent locationBoston
    CountryUS - United States
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsdiamond ; plasma-enhanced CVD (PECVD) (deposition) ; microstructure
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsLC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    IAAX00100902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    KAN400480701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    CEZAV0Z10100521 - FZU-D (2005-2011)
    AnnotationWe employ UV photolithographic and electron beam lithographic patterning of diamond seeding layer on SiO2/Si substrates for the selective growth of micrometer and sub-micrometer diamond patterns. Using bottom-up strategy, thin diamond channels (470 nm in width) are directly grown. Differences between wet chemical and plasma treatment on the patterned diamond growth are studied. We find that the density of parasitic diamond crystals (outside predefined patterns) is lowered for gas mixture CF4/O2 plasma than for rich O2 plasma. After CF4/O2 plasma treatment, the density of parasitic crystals is 106 cm-2 which is comparable to the wet chemical treatment. Introducing sandwich-like structure, i.e. photoresist-seeding layer-photoresist, and its treatment (lift-off and CF4/O2 plasma) further reduces the density of parasitic crystals down to 105 cm-2.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2011
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.