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Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil): fullerene heterostructures detected by Kelvin force microscopy
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SYSNO ASEP 0354952 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Time-resolved opto-electronic properties of poly(3-hexylthiophene-2,5-dyil): fullerene heterostructures detected by Kelvin force microscopy Author(s) Čermák, Jan (FZU-D) RID, SAI, ORCID
Rezek, Bohuslav (FZU-D) RID, ORCID
Cimrová, Věra (UMCH-V) RID, ORCID
Fejfar, Antonín (FZU-D) RID, ORCID, SAI
Purkrt, Adam (FZU-D) RID
Vaněček, Milan (FZU-D) RID
Kočka, Jan (FZU-D) RID, ORCID, SAINumber of authors 7 Source Title Thin Solid Films. - : Elsevier - ISSN 0040-6090
Roč. 519, č. 2 (2010), s. 836-840Number of pages 5 s. Language eng - English Country CH - Switzerland Keywords photovoltaics ; bulk-heterojunction ; atomic force microscopy ; Kelvin force microscopy Subject RIV BM - Solid Matter Physics ; Magnetism R&D Projects GD202/09/H041 GA ČR - Czech Science Foundation (CSF) LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) 1M06031 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100521 - FZU-D (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) UT WOS 000284499500050 DOI 10.1016/j.tsf.2010.08.132 Annotation Thin blend polymer films made of P3HT and fullerene derivatives are studied by Kelvin force microscopy (KFM). Shifting of the surface potential under white light illumination is attributed to free charge carrier generation and redistribution. Decrease of the photo-induced shifting in time is most probably attributed to degradation of the films in air. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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